中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2020, Vol. 20 ›› Issue (1): 010106 . doi: 10.16257/j.cnki.1681-1070.2020.0106

• 封装、组装与测试 • 上一篇    下一篇

基于抖动的 Serdes 接口误码率量产测试评价方法

毛意诚,李世杰,贾宁刚   

  1. 中国航天科技集团公司第九研究院第七七一研究所,西安 710000
  • 收稿日期:2019-09-27 出版日期:2020-01-15 发布日期:2020-01-15
  • 作者简介:毛意诚(1990—),男,陕西宝鸡人,本科,工程师,从事SoC、SiP芯片测试开发工作。

Evaluation Method of Bit Error Rate in Serdes Interface Based on Jitter

MAO Yicheng, LI Shijie, JIA Ninggang   

  1. 771 Institute of the 9th Institute of China Aerospace Science and Technology Corporation, Xi’an 710000, China
  • Received:2019-09-27 Online:2020-01-15 Published:2020-01-15

摘要: 高速串行接口应用的普及给集成电路性能测试带来了新的挑战。误码率(BER)是衡量通信系统性能的关键指标,衡量高速Serdes接口的误码率是十分必要的。通常测试误码率时需要发送大量数据通过长时间稳定的运行,统计接收到的错误比特数来计算误码率,测试时不仅需要大量测试时间,还需在测试路径等硬件中对信号完整性进行优化,避免出现由于测试本身对结果产生影响。从误码率产生的机理出发,探寻一种高效、可靠的误码率评价方法,提出一种基于抖动(jitter)的误码率量产测试方案。

关键词: 误码率, 抖动, 概率密度函数, 确定性抖动, 随机抖动, 自动测试设备

Abstract: The popularization of high-speed serial interface brings new challenges to IC test. Bit error rate(BER) is a key index to measure the performance of communication system. Measuring the bit error rate of high-speed Serdes interface is very necessary. Usually, to test the bit error rate, a large amount of data needs to be sent to calculate the bit error rate with the number of error bits received by performance meter over a long period of time. The test not only needs a lot of time, but also needs to optimize the signal integrity in test path and other hardware to avoid the impact of itself on results. Starting from the mechanism of bit error rate, an efficient and reliable bit error rate test method is explored, and a jitter based mass production test scheme of bit error rate is proposed.

Key words: bit error rate, jitter, probability distribution function, data dependent jitter, random jitter, automatic test equipment

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