关键词: 内置自检测, 乘法器测试, 加法器测试, DSP, FPGA, Virtex-4

Abstract: In the paper,a new method of Built-In Self-Test(BIST)for testing and diagnosing the embedded digital signal processors(DSPs)in Xilinx Virtex-4/5 series Field Programmable Gate Arrays(FPGAs)is presented.The method can effectively test the multiplier and adder in the DSP circuit,shorten the test time and reduce the workload.Meanwhile,the function test of the whole chip DSP can be realized by changing the configuration information of the DSP,and the test fault coverage of the DSP module is improved.

Key words: built-in self-test, multiplier test, adder test, digital signal processor, field programmable gate array, Virtex-4