中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2022, Vol. 22 ›› Issue (8): 080204 . doi: 10.16257/j.cnki.1681-1070.2022.0804

• 封装、组装与测试 • 上一篇    下一篇

基于FPGA的自动测试设备信号延时误差测量

季振凯;吴镇   

  1. 无锡中微亿芯有限公司,江苏 无锡 214072
  • 收稿日期:2022-01-06 出版日期:2022-08-26 发布日期:2022-04-26
  • 作者简介:季振凯(1986—),江苏泰兴人,本科,高级工程师,主要从事超大规模集成电路测试应用以及可靠性验证的研究工作。

Measurement of Signal Delay Error of Automatic Test Equipment Based on FPGA

JI Zhenkai, WU Zhen   

  1. East Technology, Inc., Wuxi 214072, China
  • Received:2022-01-06 Online:2022-08-26 Published:2022-04-26

摘要: 为满足集成电路自动测试设备(ATE)通道间信号同步的需求,基于FPGA提出了一种ATE激励信号传输延时误差的测量方法。该方法硬件结构简单,充分发挥了FPGA与ATE的特性。实验结果表明,该方法的测量结果与示波器测量结果误差在4%以内,能满足激励信号频率小于200 MHz的测量要求。

关键词: FPGA, 传输延时, 自动测试设备, 信号同步

Abstract: To meet the demand of signal synchronization between channels of integrated circuit automatic test equipment (ATE), a measure method of excitation signal transmission delay error of ATE based on FPGA is proposed. This method has a simple hardware structure and makes full use of the characteristics of FPGA and ATE. Experimental results show that this method achieves an error of less than 4% compared with the measurement results of an oscilloscope, and can meet the measurement requirement of excitation signal frequency of less than 200 MHz.

Key words: FPGA, transmission delay, automatic test equipment, signal synchronization

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