中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2023, Vol. 23 ›› Issue (10): 100203 . doi: 10.16257/j.cnki.1681-1070.2023.0132

• 封装、组装与测试 • 上一篇    下一篇

基于通用异步收发器的高速SerDes测试

柏娜1,2,朱非凡1,2,许耀华1,2,王翊1,2,陈冬1,2   

  1. 1. 安徽大学信息材料与智能感知安徽省实验室,合肥 230601;2. 安徽大学物联网频谱感知与测试工程技术研究中心,合肥 230601
  • 收稿日期:2023-03-24 出版日期:2023-10-31 发布日期:2023-10-31
  • 作者简介:柏娜(1977—),女,安徽蚌埠人,博士,副教授,硕士生导师,主要研究方向为SerDes电路设计及抗辐照电路设计。

High-Speed SerDes Testing Based on Universal Asynchronous Transceiver

BAI Na1,2, ZHU Feifan1,2, XU Yaohua1,2, WANG Yi1,2, CHEN Dong1,2   

  1. 1. Information Materials andIntelligent Sensing Laboratory of Anhui Province, Anhui University, Hefei 230601, China; 2. Engineering Technology ResearchCenter of Internet of Things Spectrum Sensing and Testing, Anhui University, Hefei 230601, China
  • Received:2023-03-24 Online:2023-10-31 Published:2023-10-31

摘要: 提出了一种基于通用异步收发器(UART)的高速串行解串器(SerDes)的调试方法。由于SerDes在封装过程中管脚数量有限,难以把物理层(PHY)的测试点全部引出作为测试芯片的管脚。为了解决此问题,引入了UART模块作为PHY与外界通信的转换模块。针对待测的SerDes IP制定测试方案,此方案将UART等模块与待测IP级联,并通过UART模块将SerDes调试所需的配置参数传输到PHY的控制寄存器,从而在控制寄存器的控制下完成对PHY内部寄存器的读写操作。在1.25 Gbit/s、20 bit的工作模式下,完成对SerDes误码率的测试,实现了对SerDes芯片参数的动态调试,大大减少了测试复杂度和测试时间。

关键词: 串行解串器, 通用异步收发器, 环回功能, 误码率, 内建自测试

Abstract: An efficient high-speed serial deserialiser (SerDes) debugging method based on universal asynchronous transceiver (UART) is proposed. Due to the limited number of pins in the packaging process of SerDes, it is difficult to pin out all the test points of the physical layer (PHY) as the pins of the test chip. To solve this problem, the UART module is introduced as the conversion module for PHY communication with the outside world. A test plan is formulated for the SerDes IP to be tested, which cascades the UART and other modules with the IP to be tested, and transfers the configuration parameters required for SerDes debugging to PHY's control register through the UART module, so as to complete the reading and writing operations of PHY's internal registers under the control of the control register. In the operating mode of 1.25 Gbit/s and 20 bit, the testing of SerDes bit error rate is completed, and dynamic debugging of SerDes chip parameters is realized, which greatly reduce the testing complexity and time.

Key words: serial deserialiser, universal asynchronous receiver, loopback function, bit error rate, built-in self-test

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