中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

导航

电子与封装 ›› 2024, Vol. 24 ›› Issue (5): 050403 . doi: 10.16257/j.cnki.1681-1070.2024.0070

• 材料、器件与工艺 • 上一篇    下一篇

N多晶电阻的温度漂移影响因子及工艺研究

陈培仓,周凌霄,洪成强,王涛,吴建伟   

  1. 无锡中微晶园电子有限公司,江苏 无锡? 214035
  • 收稿日期:2023-11-24 出版日期:2024-05-27 发布日期:2024-05-27
  • 作者简介:陈培仓(1981—),男,江苏连云港人,硕士,高级工程师,主要研究方向为集成电路工艺、测试和半导体传感器产品研制。

N Polycrystalline Resistor Temperature Drift Influence Factor and Process Research

CHEN Peicang, ZHOU Lingxiao, HONG Chengqiang, WANG Tao, WU Jianwei   

  1. Wuxi Zhongwei Microchips Co.,Ltd., Wuxi 214035, China
  • Received:2023-11-24 Online:2024-05-27 Published:2024-05-27

摘要: 多晶电阻在集成电路中应用广泛,可用作电路负载、阻尼、分压或分流,但是在实际使用过程中,多晶掺杂电阻的阻值由载流子浓度和迁移率决定,而2者都会受到温度的影响,因此多晶电阻的阻值随温度的变化而变化,且存在一定的温度系数。对N多晶电阻的温度漂移影响因子展开研究并进行分组实验验证,制备出了温度系数在±10×10-6/℃以内的低温度漂移、高精度半导体N多晶电阻,保证了不同温度环境下电路的工作稳定性,为高稳定电路设计了提供参考依据。

关键词: 多晶电阻, 掺杂, 温度漂移

Abstract: Polycrystalline resistors are widely used in integrated circuits as circuit loads, damping, voltage-sharing or current-sharing. However, the resistance value of polycrystalline doped resistors is determined by the carrier concentration and mobility in practice, and both of them are affected by the temperature, so the resistance value of polycrystalline resistors varies with the change of temperature, and there is a certain temperature coefficient. The temperature drift influence factor of N polycrystalline resistor is investigated and verified by group experiments. Low-temperature-drift and high-precision semiconductor N polycrystalline resistors with a temperature coefficient within ±10×10-6/℃ are prepared, which ensure the stability of circuits under different temperature environments, and provide a reference for the design of high-stability circuits.

Key words: polycrystalline resistor, doping, temperature drift

中图分类号: