中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2025, Vol. 25 ›› Issue (5): 050201 . doi: DOI: 10.16257/j.cnki.1681-1070.2025.0062

• 封装、组装与测试 • 上一篇    下一篇

塑封集成电路焊锡污染影响与分析

邱志述,胡敏   

  1. 乐山无线电股份有限公司,四川 乐山 614000
  • 出版日期:2025-06-04 发布日期:2025-06-04
  • 作者简介:邱志述(1974—),男,四川人,硕士,高级工程师,现从事半导体封装测试相关技术工作; 胡敏(1969—),男,四川人,硕士,高级工程师,现从事半导体封装测试相关技术工作。

Impact and Analysis of Solder Contamination on Molded IC

QIU ZhiShu, HU Min   

  1. Leshan Radio Company, Ltd., Leshan 614000, China
  • Online:2025-06-04 Published:2025-06-04

摘要: 塑封集成电路(IC)受潮气侵蚀造成离子污染而引起的可靠性问题较为常见,由印刷电路板焊锡污染而引起的则不多。介绍印刷电路板焊锡污染导致IC可靠性失效的实际案例,指出焊锡污染发生的条件,通过对IC塑封体元素成分的分析,得出焊锡污染可能导致IC可靠性失效的原因。通过对失效品加热及再次老化,让IC性能恢复和再次失效。从原理上解释了焊锡污染IC封装塑封体是不可恢复的,在特定条件下还可能会再次失效。对SMT工程师给出建议,以避免类似焊锡污染IC导致可靠性失效。

关键词: 回流焊, 波峰焊, 印刷电路板, 表面安装技术

Abstract: Molded integrated circuits (IC) reliability issue caused by ionic contamination due to package moisture erosion is more common, which caused by solder contamination of printed circuit boards is not much. The actual case of IC reliability failure caused by printed circuit board solder contamination is introduced, the conditions for the occurrence of solder contamination is pointed out, and it is concluded that solder contamination may lead to IC reliability failure by analyzing the elemental composition of IC molding body. By heating the failed product and aging it again, the IC appears to get better and fail again. In principle, it explains that solder contamination of IC package is not recoverable and may fail again under certain conditions. Suggestions are given to SMT engineers to avoid reliability failures caused by similar solder contaminated IC.

Key words: packaging, MEMS, dispensing glue

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