关键词: FPGA, 配置时间, 压缩测试, ATE

Abstract: With the increase in the size of the FPGA,the size of the configuration code is getting bigger and the configuration time is getting longer for FPGA test.Therefore,reducing test time has great significance to improve the test efficiency.On the basis of bit stream compression and vector loading,a variety of test compression methods,including FPGA bit stream compression based on multi frame writing,X mode test compression and multiport test compression based on ATE,are investigated.The test for Xilinx Virtex-5 FPGA XC5VLX155T illustrated those methods.The testresults show thatthe testcompression methods can reduce the test time of a single FPGA at least 25.5 s,greatly reduce the requirement for the vector space of the test system,shorten the test configuration time and improve the test efficiency of FPGA.The proposed methods also provide a good reference forother typesofdigitalcircuittesting.

Key words: FPGA, configuration time, compression test, ATE