关键词: RRAM芯片, ATE, 测试算法, 结构分析

Abstract: In order to test the resistive-variable memory (RRAM) chip, the performance, working mode and chip timing are analyzed and summarized based on the basic structure, interface definition and function of the RRAM chip. The capacity of the RRAM chip is measured by combining formula calculation with actual measurement techniques. The results show that the formula calculation based on structural analysis can calculate the capacity of the RRAM chip based on the spacing of the RRAM memory cells. An automatic testing system is used to verify the function of the RRAM chip. At the same time, a durability testing device for the RRAM chip is designed, and the erasing performance of the RRAM chip is evaluated comprehensively.

Key words: RRAM chip, ATE, testing algorithm, structural analysis