关键词: 芯片测试, 低压差线性稳压器, 多工位测试

Abstract: With the development of science and technology, the function, reliability and stability of hardware chip become more and more important, which makes chip test more and more important. Due to its low cost, wide application and huge market demand, low dropout regulator is indispensable in hardware testing. However, the testing methods of LDO chips are different according to their wafer substrates. This paper will study the multi-site test method of LDO chip under different substrates, so as to effectively improve the test efficiency and reduce the test cost.

Key words: chiptest, lowdropoutregulator, multi-sitetest