中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2022, Vol. 22 ›› Issue (11): 110302 . doi: 10.16257/j.cnki.1681-1070.2022.1102

• 电路与系统 • 上一篇    下一篇

抗辐射LDO单粒子效应的测控系统设计与实现

李欢;顾小明;徐晴昊   

  1. 中国电子科技集团公司第五十八研究所,江苏 无锡 214035
  • 收稿日期:2022-03-18 出版日期:2022-11-29 发布日期:2022-05-26
  • 作者简介:李欢(1991—),男,江苏徐州人,本科,工程师,主要研究方向为模拟集成电路测试。

Design and Implementation of Measurement and Control System for Single Event Effect of Radiation Resistant LDO

LI Huan, GU Xiaoming, XU Qinghao   

  1. ChinaElectronics Technology Group Corporation No.58 Research Institute, Wuxi 214035, China
  • Received:2022-03-18 Online:2022-11-29 Published:2022-05-26

摘要: 随着低压差线性稳压器(LDO)在航空、航天等领域的广泛应用,其抗单粒子能力的指标也愈发重要。为了实现实时监测LDO器件同粒子下发生的单粒子效应,设计了针对LDO器件在不同粒子下的单粒子效应测试方法并构建了一种高速、多通道数据采集测控系统。系统以NI工控机为核心,通过PXIe总线外接程控仪器的方式,可测量的最高信号频率达到60 MHz。该系统支持远程数据传输,可实时监测LDO器件在单粒子辐照下的功耗性能,满足单粒子效应试验需求,为LDO器件的单粒子效应研究提供数据参考。

关键词: 低压差线性稳压器, 单粒子效应, 测试系统

Abstract: With the wide application of low dropout linear regulator (LDO) devices in aerospace and other fields, the index of its anti single particle ability is becoming more and more important. In order to realize the real-time monitoring of the single event effect of LDO devices under different particles, a test method for the single event effect of LDO devices under different particles is designed, and a high-speed, multi-channel data acquisition, measurement and control system is built. The system takes the NI industrial computer as the core, and can measure the signal frequency up to 60 MHz through the PXIe bus and external program-controlled instruments. The system supports remote data transmission and can monitor the power consumption performance of LDO devices under single-event irradiation in real time to meet the requirements of single event effect test, and provide data reference for the experimental research of single event effect of LDO devices.

Key words: low dropout linear regulator, single event effect, testing system

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