中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2017, Vol. 17 ›› Issue (4): 12 -15. doi: 10.16257/j.cnki.1681-1070.2017.0045

• 封装、组装与测试 • 上一篇    下一篇

金层和银层铟基焊料钎焊界面组织性能研究

杨东升1,张 悦2,田艳红2,叶育红1   

  1. 1.中国电子科技集团公司第55研究所,南京 210016;2.哈尔滨工业大学先进焊接与连接国家重点实验室,哈尔滨 150001
  • 收稿日期:2016-11-30 出版日期:2017-04-20 发布日期:2017-04-20
  • 作者简介:杨东升(1985—),男,工学硕士,主要从事微电子焊接的研究工作。

Study of Microstructural Properties of In-based Solder Joints Interface

YANG Dongsheng1,ZHANG Yue2,TIAN Yanhong2,YE Yuhong1   

  1. 1.China Electronics Technology Group Corporation No.55Research Institute,Nanjing210016,China;2.Harbin Institute of Technology,Harbin150001,China
  • Received:2016-11-30 Online:2017-04-20 Published:2017-04-20

摘要: 对In40Pb60的铟基近共晶钎料钎焊金属基板钎焊界面(即Cu/Ni/Au/InPb/Ag/Ni/Al结构)进行研究。分析钎焊界面焊点处显微结构及各层成分及厚度,对钎焊焊点进行高温老化,利用SEM对焊点钎料成分与界面形成的金属间化合物进行检测,并进行剪切力学性能测试。结果表明,短时间的老化后焊点AuIn2和AgIn2金属间化合物的生成使得焊点力学性能有一定提高,但IMC层不宜过厚,厚度过大焊点的剪切性能会随老化的推进略有下降,应该控制脆性物质的生成使得焊点力学性能达到最高。

关键词: In基焊料, 金属间化合物, 剪切性能, 可靠性

Abstract: InPb solders joints interface(Cu/Ni/Au/InPb/Ag/Ni/Al)is briefly analyzed in the paper.The solders microstructure and thickness of composition are analyzed.The solder joints are isothermal aged at high temperature.After aging is the shear mechanics performance test,then the microstructures of the solder joints in the solder joints are observed using SEM.Result shows that after aging for a short period of time,the shear strength of the two kinds of solder joints increases due to the generation of AuIn2and AgIn2.When the IMCs are too thick,shear strength decreases along with the aging test.The formation of the interface intermetallic should be controlled to improve the shear strength of the InPb solder joints.

Key words: In-based solder, intermetallic compound, shear strength, reliability

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