中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2018, Vol. 18 ›› Issue (1): 5 -7. doi: 10.16257/j.cnki.1681-1070.2018.0002

• 封装、组装与测试 • 上一篇    下一篇

结晶硅微粉对KBJ元器件封装用EMC气孔的影响

张未浩,谢广超,于轩,丁全青,陈波   

  1. 衡所华威电子有限公司,江苏连云港 222006
  • 收稿日期:2017-09-16 出版日期:2018-01-20 发布日期:2018-01-20
  • 作者简介:张未浩(1991—),男,安徽淮北人,硕士学历,现任衡所华威电子有限公司研发工程师,主要从事模塑料新产品的开发工作。

The Effect of Crystalline Silicon Powder on the Void of EMC Encapsulation in KBJ Device Package

ZHANG Weihao,XIE Guangchao,YU Xuan,DING Quanqing,CHEN Bo   

  1. Hysol Huawei Electronics Co.,Ltd.,Lianyungang 222006,China
  • Received:2017-09-16 Online:2018-01-20 Published:2018-01-20

摘要: 以3种不同类型的结晶硅微粉为主要填料,环氧树脂为基体树脂,酚醛树脂为固化剂,通过调节3种结晶硅微粉的含量和比例,制备出3种不同的环氧模塑料(EMC)并用于封装KBJ元器件。采用激光粒度分析仪分析3种结晶硅微粉的粒径,毛细流变仪测试EMC粘度,万能测试机、恒温加热板测试其螺旋流动长度和凝胶化时间,并研究3种不同EMC对封装KBJ元器件中气孔的影响。

关键词: 结晶硅微粉, 环氧模塑料, 气孔, KBJ元器件

Abstract: Based on three different types of crystalline silica powder filler,epoxy resin as matrix resin,phenolic resin as curing agent,by adjusting the content and ratio of three crystalline silica powders,three different epoxy molding plastics(EMC)were prepared and used to encapsulate KBJ components.The particle size analysis of three crystalline silica fume was carried out by using laser particle size analyzer,and the capillary rheometer wasused to testthe flow length and gelation time ofEMCviscosity and universal tester and thermostatic heating plate,and study the influence ofthree differentEMCon the void ofencapsulated KBJ components.

Key words: crystalline silicon powder, EMC, void, KBJ device package

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