中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2020, Vol. 20 ›› Issue (11): 110204 . doi: 10.16257/j.cnki.1681-1070.2020.1110

• 封装、组装与测试 • 上一篇    下一篇

SOT23 塑封体裂纹分析与改进

程琪,李进,袁健   

  1. 长兴电子材料有限公司,江苏 昆山 215301
  • 收稿日期:2020-06-03 发布日期:2020-07-14
  • 作者简介:程琪(1993—),女,山东济宁人,硕士研究生,现主要从事环氧塑封料(EMC)的相关工作。

Analysis and Improvement of PlasticPackage Crack of SOT23 Product

CHENG Qi, LI Jin, YUAN Jian   

  1. EternalElectronic Materials Co. Ltd, Kunshan 215301, China
  • Received:2020-06-03 Published:2020-07-14

摘要: SOT系列产品塑封体裂纹是半导体封装工艺中常见的失效模式之一,尤其是SOT23塑封体裂纹。由于塑封体裂纹的多样性及隐蔽性,极大地影响产品成品率,造成质量隐患。通过分析导致裂纹产生的原因,并进行相关试验验证,最终提出一套行之有效的方法以解决SOT23塑封体裂纹问题。

关键词: 裂纹, SOT23, 塑封体

Abstract: The crack in plastic package of SOT series products is one of the common failure modes in the semiconductor packaging process, especially SOT23 plastic package crack. Due to the diversity and concealment of the cracks in the plastic package, the qualified rate of products is greatly affected and the hidden trouble in quality is caused. By analyzing the causes of the cracks and carrying out relevant experimental verification, a set of effective methods was put forward to solve the SOT23 plastic package crack at last.

Key words: crack, SOT23, plastic package

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