电编程熔丝的冗余备份及修正设计策略

doi:10.16257/j.cnki.1681-1070.2024.0132

电子与封装 ›› 2024, Vol. 24 ›› Issue (10): 100303 . doi: 10.16257/j.cnki.1681-1070.2024.0132

电编程熔丝的冗余备份及修正设计策略

胡晓明,晏颖

上海华力集成电路制造有限公司，上海?201316

收稿日期:2024-03-05 出版日期:2024-10-25 发布日期:2024-10-25
作者简介:胡晓明（1976—），男，浙江宁波人，高级工程师，设计服务部总监，主要研究方向为半导体制造与器件研发；

Redundant Backup and Corrective Design Strategies for Electronic Programming Fuses

HU Xiaoming, YAN Ying

Shanghai HuaLi MicroelectronicCorporation, Shanghai, 201316, China

Received:2024-03-05 Online:2024-10-25 Published:2024-10-25

摘要/Abstract

摘要： 由于工艺、制造和环境等原因，电编程熔丝（eFUSE）存储的数据信息可能发生意外改变，需要通过专门设计对数据进行冗余备份或对失效数据位进行修正，前者是对2个互为冗余的数据位进行相同编程操作，多用于eFUSE的现场编程；后者对失效数据位的修正大多采用的是串行冗余修正模式，但由于其存在延时随失效位数目增加的问题，一种以同步方式修正失效数据位的并行解决策略被提出并实现验证。

关键词: 电编程熔丝, 失效, 冗余修正, 并行, 电路设计

Abstract: Due to factors such as process, manufacturing, and environment, the data stored in electronic programming fuses (eFUSEs) may undergo unexpected changes, requiring specialized design for data redundant backup or failure correction. The former performs the same programming operation on two mutually redundant data bits, which is commonly required in on-site programming of eFUSE. The latter correction of failed data bits mostly adopts the serial redundancy correction mode, but since the operation delay increases with the number of failed bits, a parallel solution strategy of synchronously correcting failure bits is proposed and implemented for validation.

Key words: eFUSE, failure, redundancy correction, parallel, circuit design

中图分类号:

TN302

胡晓明,晏颖. 电编程熔丝的冗余备份及修正设计策略[J]. 电子与封装, 2024, 24(10): 100303 .

HU Xiaoming, YAN Ying. Redundant Backup and Corrective Design Strategies for Electronic Programming Fuses[J]. Electronics & Packaging, 2024, 24(10): 100303 .

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电编程熔丝的冗余备份及修正设计策略

Redundant Backup and Corrective Design Strategies for Electronic Programming Fuses

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