中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2024, Vol. 24 ›› Issue (10): 100304 . doi: 10.16257/j.cnki.1681-1070.2024.0137

• 电路与系统 • 上一篇    下一篇

典型电源监控电路测试系统研制

文科,钟昂,戴畅,余航,罗俊   

  1. 中国电子科技集团公司第二十四研究所,重庆?400060
  • 收稿日期:2024-05-07 出版日期:2024-10-25 发布日期:2024-10-25
  • 作者简介:文科(1987—),男,重庆人,硕士,高级工程师,主要研究方向为微电子集成电路可靠性及测试技术。

Development of Typical Power Supply Monitoring Circuit Test System

WEN Ke, ZHONG Ang, DAI Chang, YU Hang, LUO Jun   

  1. ChinaElectronics Technology Group Corporation No.24Research Institute, Chongqing 400060,China
  • Received:2024-05-07 Online:2024-10-25 Published:2024-10-25

摘要: 基于典型电源监控电路TPS3307-18M的电特性开展测试系统研究,分析了该款产品电参数特性。从测试系统整体功能实现、外围仪器设备使用、测试准确性、可靠性评估等方面进行了评估,通过设计电源模块、控制模块以及自控恒流源模块等完成测试系统硬件设计,采用Visual Basic编程实现上位机界面和控制操作,最终实现电源监控电路的测试系统研制,同时也为类似产品测试系统研制与设计提供思路和参考。

关键词: 测试系统, 电源模块, 电参数, 硬件设计

Abstract: A test system study is carried out based on the electrical characteristics of a typical power supply monitoring circuit TPS3307-18M, and the electrical parameter characteristics of this product are analyzed. The overall function implementation of the test system, the use of peripheral instruments and equipment, the test accuracy, the reliability assessment and other aspects are evaluated, and the hardware design of the test system is completed through the design of the power supply module, the control module and the self-contained constant-current source module, etc. The Visual Basic programming is used to achieve the upper computer interface and control operation. Finally, the development of the test system of the power supply monitoring circuit is realized, providing ideas and references for the development and design of test system for similar products.

Key words: test system, power supply module, electrical parameter, hardware design

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