中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装

• 封装、组装与测试 •    下一篇

硅基射频微系统的传热及热-力耦合仿真研究

孙浩洋,高一睿,姬峰,兰梦伟,王成伟,韩宇,张鹏哲,郭振华   

  1. 北京遥感设备研究所,北京  100854
  • 收稿日期:2025-10-11 修回日期:2025-11-18 出版日期:2025-11-28 发布日期:2025-11-28
  • 通讯作者: 孙浩洋
  • 基金资助:
    国家自然科学基金“叶企孙”科学基金项目(U2141218)

Heat Transfer and Thermal-Force Coupling Simulation of Silicon-Based Radio-Frequency Microsystems

SUN Haoyang, GAO Yirui, JI Feng, LAN Mengwei, WANG Chengwei, HAN Yu, ZHANG Pengzhe, GUO Zhenhua   

  1. Beijing Institute of Remote Sensing Equipment, Beijing 100854, China
  • Received:2025-10-11 Revised:2025-11-18 Online:2025-11-28 Published:2025-11-28

摘要: 射频系统作为信息发送和接收的核心部件,在信息的精确传递中扮演着重要的角色。随着电子设备向小型化、高密度集成和高功率密度的趋势发展,射频微系统以其高性能、高可靠和低成本的优势成为主流产品。由于射频微系统体积小,功率密度高,工作过程中的散热问题日益凸显,将对其可靠性产生影响。因此,需要通过有限元仿真的方式对微系统在工作下的可靠性进行预判,以优化设计。以基于一种三维异构集成方式研制的一款射频微系统为例,通过有限元仿真的方式对射频微系统的传热及热-力耦合特性进行分析,对射频微系统在工作下的热学和力学特性进行预判,有效规避了设计风险,为射频微系统的高可靠性提供支撑。

关键词: 硅基射频微系统, 热-力耦合, 有限元仿真, 三维异构集成

Abstract: As the core component of information transmission and reception, radio-frequency system plays an important role in the precise transmission of information. With the trend of electronic devices towards miniaturization, high-density integration and high power density, radio-frequency microsystems have become mainstream products with their advantages of high performance, high reliability and low cost. Due to the small size and high power density of radio-frequency microsystems, the heat dissipation problem during the working process is becoming more and more prominent, which will have an impact on their reliability. Therefore, the reliability of microsystems under operation needs to be simulated by means of finite element method to optimize the product performance. A radio-frequency microsystem is developed through three-dimensional heterogeneous integration method, and its the heat transfer and thermal-force coupling characteristics are analyzed by means of finite element simulation to prejudge the thermal and mechanical characteristics of the radio-frequency microsystem under operation, which effectively avoids the design risk and provides support for the high reliability of the radio-frequency microsystem.

Key words: silicon-based radio-frequency microsystems, thermal-force coupling, finite element simulation, three-dimensional heterogeneous integration