关键词: 单粒子翻转, 抗辐射加固, 触发器, 三模冗余

Abstract: Digital logic technology scaling results in greater sensitivity to the radiation effect when used in space. Especially in date flip-flop, Single-Event Upset may make the data in flip-flop change and cause complete failure of circuit function. The paper introduces a design of TMR (Triple Modular Redundancy) flip-flop with self-refresh function, which improves the traditional design of TMR flip-flop that only corrects the output through vote gate without refreshing the error bits.

Key words: Single-Event Upset, radiation hardness, flip-flop, Triple Modular Redundancy