关键词: 测试成本, 自动化测试设备, 可测性设计, 内建自测试

Abstract: The integrated circuit manufacturing process is extremely complex,it mainly including design，manufacturing，packaging，testing，reliability,etc.Every individual semiconductor product needs to undergo stringent electrical tests to weed out the defective parts and guarantee outgoing product quality to the customer.A large number of test requirements make the test cost more and more.Seek a test method is very important,it can notonly guarantee the quality of the productbutalso controlthe testcosteffectively.

Key words: testcost, ATE, DFT, BIST