中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2022, Vol. 22 ›› Issue (10): 100403 . doi: 10.16257/j.cnki.1681-1070.2022.1006

• 材料、器件与工艺 • 上一篇    下一篇

基于加速寿命试验的磁耦隔离器耐压寿命评价方法

曹玉翠1;李泽田2;胡林江1;张峰1   

  1. 1. 中国科学院自动化研究所,北京 100098;2. 中央军委装备发展部军事代表局驻北京地区第二军事代表室,北京 100042
  • 收稿日期:2022-03-22 出版日期:2022-10-26 发布日期:2022-05-09
  • 作者简介:曹玉翠(1994—),女,河北邢台人,硕士,助理工程师,主要研究方向为集成电路测试、可靠性评价。

Evaluation Method of Withstand VoltageLife of Magnetic Coupling Isolator Based on Accelerated Life Test

CAO Yucui1, LI Zetian2, HU Linjiang1, ZHANG Feng1   

  1. 1. Institute of Automation, Chinese Academy of Sciences, Beijing 100098, China; 2. Second MilitaryRepresentative Office of Military Representative Bureau in Beijing Area, Equipment Development Department, Beijing 100042, China
  • Received:2022-03-22 Online:2022-10-26 Published:2022-05-09

摘要: 为解决磁耦隔离器耐压寿命评估的实际需求,研究了适用于磁耦隔离器的加速寿命试验与寿命评估方法。研究了影响磁耦隔离器耐压寿命的关键因素,分析加速寿命试验的可行性与加速模型的选取。合理设计加速寿命试验方案中的应力类型、应力水平、截尾时间等,并按照设计的试验电路方案进行试验。利用采集到的试验数据,结合加速模型推出电压-寿命之间的关系,实现磁耦隔离器耐压寿命的评估和可靠性评价。

关键词: 磁耦隔离器, 加速寿命试验, 耐压寿命, 可靠性

Abstract: In order to solve the actual needs of the withstand voltage life evaluation of magnetic isolators, an accelerated life test and life evaluation method suitable for magnetic isolators is studied. The key factors affecting the withstand voltage life of the magnetic coupling isolator are studied, and the feasibility of the accelerated life test and the selection of the accelerated model are analyzed. The stress type, stress level, censoring time in the accelerated life test scheme are reasonably designed and the test is carried out according to the designed test circuit scheme. The relationship between voltage and life is deduced by using the collected test data and combined with the acceleration model, so as to realize the evaluation and reliability evaluation of the withstand voltage life of the magnetic coupling isolator.

Key words: magnetic isolator, accelerated life test, withstand voltage life, reliability

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