关键词: 长寿命抗干扰测试针, 高频器件, 成品率

Abstract: During semiconductor test measurements, the contact finger is one of the mAin contributors to high accuracy and precision. Two concerns must be focused to design a good test contact finger. One is good kelvin test contact at test device lead pad, another is test interference from external electrical noise for high frequency (HF) SOT device (>2 GHz). To achieve a high precision test measurement in auto mAtic production line, frequent replacement of the worn-out test contact fingers should be performed to sustain good test yield. Another concern is high frequency devices facing HFE test oscillation and causing yield loss. To solve these issues, a new design of long life test contact fingers and high consideration of anti-oscillation/anti-electrical noise design must be developed. In the paper, the new design method of long life span and anti-interference test contact finger is introduced via SOT363 test contact finger.

Key words: long-life and anti-interference contact finger, high frequency devices, yield