中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2021, Vol. 21 ›› Issue (1): 010202 . doi: 10.16257/j.cnki.1681-1070.2021.0101

• 封装、组装与测试 • 上一篇    下一篇

ADC测试中同源时钟分析与解决方案

钱宏文,刘继祥,吴翼虎,饶飞   

  1. 中科芯集成电路有限公司,江苏 无锡 214072
  • 收稿日期:2020-04-09 出版日期:2021-01-20 发布日期:2020-08-20
  • 作者简介:钱宏文(1975—),男,江苏无锡人,本科学历,研究员级高级工程师,主要研究方向为集成电路应用和微系统。

Analysis and Solution of Homologous Clock in ADC Test

QIAN Hongwen, LIU Jixiang, WU Yihu, RAO Fei   

  1. China Key System & Integrated Circuit Co., Ltd., Wuxi 214072,China
  • Received:2020-04-09 Online:2021-01-20 Published:2020-08-20

摘要: 在进行ADC测试中,使用同源时钟进行ADC数据采集并对静态指标进行分析时,出现严重的丢码现象,导致静态指标测试结果严重超差。基于此问题及引申出的其他问题进行相关分析,以此为基础从理论分析到实物验证,完美解决同源时钟静态指标测试问题。

关键词: ADC, 同源, 码密度

Abstract: In the ADC test, when using the homologous clock to collect ADC data and analyze the static indicators, there is a serious loss of code, which leads to serious out of tolerance of the static specifications test results. Based on this problem and other problems, this paper makes a correlation analysis, and on this basis, from theoretical analysis to physical verification, perfectly solves the problem of homologous clock static specifications test.

Key words: ADC, homology, codedensity

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