[1] 张亮, 韩永典, 尹立孟, 等. 电子互连无铅钎料及焊点蠕变行为研究进展[J]. 稀有金属材料与工程, 2023, 52(12): 4307-4324. [2] 王凤江, 董传淇. SnAgCu/SnBi混装焊点的热循环可靠性研究[J]. 江苏科技大学学报(自然科学版), 2024, 38(2): 31-35. [3] CAI C Y, XU J F, WANG H Y, et al. A comparative study of thermal fatigue life of eutectic Sn-Bi, hybrid Sn-Bi/SAC and SAC solder alloy BGAs[J]. Microelectronics and Reliability, 2021, 19(4): 114065. [4] 包诚, 徐幸, 程明生. 热疲劳载荷作用下不同成分BGA互连焊点可靠性[J]. 电子与封装, 2015, 15(7): 5-9, 13. [5] 张君直, 凌显宝, 袁汉钦, 等. Pb90Sn10焊点硅基器件与PCB板组装的温循可靠性研究[J]. 固体电子学研究与进展, 2023, 43(4): 370-374. [6] 张健健, 吴超, 陶少杰. Au-Al键合界面金属间化合物对可靠性影响的研究[J]. 中国集成电路, 2024, 33(6): 82-89. [7] 胡虎安, 贾强, 王乙舒, 等. 功率器件封装用Cu-Sn全IMC接头制备及其可靠性研究进展[J]. 电源学报, 2024, 22(3): 62-71. [8] 杜文晶, cycles文艳, 裴洪营, 等. 键合界面金属间化合物对可靠性影响的研究现状[J]. 贵金属, 2023, 44(1): 92-101. [9] ZARMAI M T, EKERE N N, ODUOZA C F, et al. Effect of Intermetallic Compound thickness on thermo-mechanical reliability of lead-free solder joints in solar cell assembly[J]. 2015 10th Annual Tech Connect World Innovation Conference and Expo, Washington, 2015. [10] CHIOU Y C, JEN Y M, HUANG S H. Finite element based fatigue life estimation of the solder joints with effect of intermetallic compound growth[J]. Microelectronics Reliability, 2011, 51(12): 2319-2329. |