关键词: ATE测试, 实装测试, 测试板设计, 故障诊断

Abstract: The CPU chip testing is realized through ATE combined with the actual system. The PCIe and UART interfaces of the CPU chip are tested based on the loopback test technology. The external Flash chips are used to realize read/write performance testing, erase testing and data retention testing of the SPI interfaces of the CPU chip. The external DDR4 chips are used to test the memory delay and time parameters of the CPU chip. The fault diagnosis and location device of the actual system is designed, and the EEPROM chips are attached to realize the real-time monitoring of the test temperature of the CPU chip, which improves the test efficiency.

Key words: ATE test, actual testing, test board design, fault diagnosis