中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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• 封装、组装与测试 •    下一篇

中低温Sn-In-Bi-(Ag,Cu)焊料成分设计及可靠性研究

梁泽1,蒋少强2,王剑2,王世堉2,聂富刚2,张耀1,周健1   

  1. 1. 东南大学材料科学与工程学院,南京  211189;2. 中兴通讯股份有限公司,广东 深圳  518057
  • 收稿日期:2025-01-06 修回日期:2025-02-21 出版日期:2025-02-26 发布日期:2025-02-26
  • 通讯作者: 周健
  • 基金资助:
    中兴通讯产学研合作项目(2024ZTE04-06)

Reliability Study of Medium and Low Temperature Sn-In-Bi-(Ag,Cu) Solders

LIANG Ze1, JIANG Shaoqiang2, WANG Jian2, WANG Shiyu2, NIE Fugang2, ZHANG Yao1, ZHOU Jian1   

  1. 1. School of Materials Science and Engineering, Southeast University, Nanjing 211189, China; 2. Zhongxing Telecom Equipment, Shenzhen 518057, China
  • Received:2025-01-06 Revised:2025-02-21 Online:2025-02-26 Published:2025-02-26
  • Contact: Jian ZHOU

摘要: 由于在较高的焊接温度下芯片和基板变形量大,导致HoP、NWO、SBB等焊接缺陷问题突出,SAC305等常规中高温焊料已不能适用于大尺寸芯片焊接工艺要求,而低熔点SnBi基焊料可靠性尚有不足。为了解决熔点与可靠性的矛盾,首先通过In、Bi的加入降低了Sn-Ag-Cu焊料的熔点(至194.1 ℃),其合金组织中并未形成低熔点相,同时根据焊点回流和高温老化的组织演变、抗跌落,高温老化,热疲劳等可靠性评价优化了Ag的含量。结果表明:相比较SAC305,新型中低温Sn-In-Bi-(Ag,Cu)焊料的回流温度可降低20~25 ℃,由于基体强化的同时,金属间化合物颗粒相的粗化得到抑制,其焊点可靠性优于SAC305合金。

关键词: 中低温焊料, Sn-In-Bi-(Ag, Cu)五元合金, 熔点, 可靠性, 金属间化合物

Abstract: The warping deformation of chips and substrates at elevated soldering temperatures has been recognized as a critical issue, giving rise to welding defects such as head-on-pillow (HoP), Non-wet- open (NWO), and solder ball bridging (SBB). As a result, traditional medium and high temperature solders, like SAC305, have been demonstrated to be insufficient for large-scale chip soldering processes, as they fail to meet the requirements of such processes. Moreover, the reliability of low melting point Sn-Bi solder remains unsatisfactory. To address the conflict between melting point and reliability, this study proposes a reduction in the melting point of Sn-Ag-Cu solder (to 194.1 ℃) through the addition of In, Bi, while ensuring that its alloy structure does not form a low melting point phase. Simultaneously, according to the solder joint reflow and high-temperature ageing of the organization evolution, drop resistance, high-temperature ageing, temperature cycling, such as the reliability of the evaluation of optimising the content of Ag, the paper puts forward a series of recommendations. The results show that the reflow temperature of the newly developed medium-low temperature Sn-In-Bi-(Ag, Cu) solder can be decreased by 20-25 ℃ compared to SAC305. Additionally, due to the suppression of the coarsening of the intermetallic compound granular phase and the strengthening of the matrix, the reliability of the solder joints is superior to that of the SAC305 alloy.

Key words: low to medium temperature solder, Sn-In-Bi-(Ag,Cu), five-membered alloys, melting point, reliability, intermetallic compound