中国电子学会电子制造与封装技术分会会刊

中国半导体行业协会封测分会会刊

无锡市集成电路学会会刊

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基于数据驱动的混合键合界面可靠性优化设计

刁文强1,张钊烊1,杨鸣宇1,王翊2,顾琴1,姜霖1   

  1. 1. 东北大学信息科学与工程学院,沈阳  110819;2. 新疆大学软件学院,新疆 乌鲁木齐  830046
  • 收稿日期:2026-07-07 修回日期:2026-08-18 出版日期:2026-08-20 发布日期:2026-08-20
  • 通讯作者: 姜霖

Data-Driven Reliability Optimization of Hybrid Bonding Interfaces

DIAO Wenqiang1, ZHANG Zhaoyang1, YANG Mingyu1, WANG Yi2, GU Qin1, JIANG Lin1   

  1. 1. School of Information Science and Engineering, Northeastern University, Shenyang 110819, China; 2. School of Software, Xinjiang University, Urumqi 830046, Xinjiang, China
  • Received:2026-07-07 Revised:2026-08-18 Online:2026-08-20 Published:2026-08-20

摘要: 三维集成芯片中混合键合界面的热力可靠性受结构参数、工艺温度及界面状态等多因素耦合影响,传统单工况有限元分析难以满足工艺-设计空间快速筛选需求。针对混合键合界面可靠性评估问题,提出一种基于有限元仿真数据库的数据驱动评估方法,并构建交互式优化设计平台。该方法首先建立局部二维平面应变有限元模型,并引入等效热力加载方法以表征关键工艺过程中的应力演化行为。在此基础上,以Cu焊盘间距、焊盘宽度、Cu凹陷等效参数及退火温度为设计变量,构建全因子有限元数据库,并提取关键界面应力响应指标。进一步地,结合熵权法与关键阶段包络风险指标建立多指标可靠性评价体系,并通过Pareto非支配筛选与辅助排序方法实现候选设计方案的快速评估与优选。结果表明,该方法能够实现混合键合界面可靠性风险的高效评估与设计空间快速筛选,为三维集成芯片混合键合结构与工艺协同优化提供有效工具支持。

关键词: 三维集成芯片, 混合键合, 界面可靠性, 有限元数据库, 协同优化, 优化设计平台

Abstract: The thermo-mechanical reliability of hybrid bonding interfaces in three-dimensional integrated circuits is governed by the coupled effects of structural parameters, process temperature, and interfacial conditions. Conventional finite-element analysis under single operating conditions is insufficient to support rapid exploration of the process–design space. To address the reliability evaluation challenge of hybrid bonding interfaces, this work proposes a data-driven assessment framework based on a finite-element simulation database and develops an interactive optimization design platform. A local two-dimensional plane-strain finite-element model is first established, and an equivalent thermo-mechanical loading strategy is introduced to capture the stress evolution across key process stages. On this basis, a full-factorial finite-element database is constructed using Cu pad pitch, pad width, Cu dishing equivalent parameter, and annealing temperature as design variables, from which key interfacial stress response metrics are extracted. Furthermore, a multi-metric reliability evaluation framework is developed by integrating the entropy-weight method with a critical-stage envelope risk indicator. Pareto non-dominated sorting and an auxiliary ranking metric are then employed to enable efficient screening and prioritization of candidate design solutions. Results demonstrate that the proposed method enables efficient evaluation of interfacial reliability risks and rapid exploration of the design space, providing an effective tool for the co-optimization of structure and process in hybrid bonding for three-dimensional integrated circuits.

Key words: 3D integrated chips, hybrid bonding, interface reliability, finite element database, co-optimization, design optimization platform