关键词: 集成电路, 测试, 开短路分析, 功能分析

Abstract: The requirement of integrated circuit testing is increasing today. In order to ensure the smooth progress of the batch engineering production test and improve the utilization efficiency of the test machine, we now diagnose and analyze some faults of the OS and functional engineering test links those are prone to occur, and eliminate some common faults to achieve rapid production test of the chip.

Key words: integrated circuit, test, open short analysis, functional Analysis