中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2019, Vol. 19 ›› Issue (7): 07 -12. doi: 10.16257/j.cnki.1681-1070.2019.0703

• 封装、组装与测试 • 上一篇    下一篇

微波产品焊点典型失效模式可靠性研究

李泊   

  1. 中国电子科技集团公司第十三研究所,石家庄 050051
  • 收稿日期:2019-05-31 出版日期:2019-07-18 发布日期:2019-07-18
  • 作者简介:李 泊(1969—),男,四川遂宁人,高级工程师,曾主持并完成多项新品及军工预研项目,长期从工微波模块及微波组件工艺的研究工作。

Reliability Study on Typical Failure Modes of Solder Joints about Microwave Products

LI Bo   

  1. China Electronics Technology Group Corporation No.13 Research Institute,Shijiazhuang 050051,China
  • Received:2019-05-31 Online:2019-07-18 Published:2019-07-18

摘要: 微波元器件引线和基板的互连方式较多,为了保证产品性能,最理想的方式是将其引线直接与基板搭焊,但这种方式仅靠焊料和引线的形变来释放应力,有一定的局限性,因此常常出现焊点开裂失效的问题。为了评估微波产品焊点释放应力的能力,介绍了在微波产品中典型的三种高热应力焊点失效模式,分析了焊点开裂的机理。使用ANSYS软件对其应力进行了仿真,结合焊点位移量及其所带来的焊点剪切应变来评估焊点热疲劳寿命,并验证了这些方法的可行性和实用性,最后提出了高应力焊点相应的工艺设计优化措施,对提高焊点可靠性具有重要的指导作用。

关键词: 微波产品, 焊点, 热应力, 失效模式, 可靠性

Abstract: Therewereplenty of methodsto connect leadsof microwavecomponentswith the circuit board,but soldering them directly on board was the best way for guaranting the microwave performances of products.However,inthismethod,thethermal stresswasonly setfreeby thedeformationof thesolder and thelead which were limited in a poor stress release capacity,generally leading to the crack of solder joints.To evaluate the stressrelease capacity of microwave productsjoints,threecommon typical failuremodesof high thermal stress solder joints were introduced,whose crack mechanisms were separately analyzed.The stress of solder joints was simulated through ANSYS software,which combined shift value of solder joints with the shearing deformation produced by it,to evaluate heat fatigue life of solder joints.The applicability and effectiveness of theseevaluationmethodswereverified.Finally,someoptimized processdesignmeasureswerepresented which werevery importantfor reliability improvementof solder joints.

Key words: microwaveproduct, solder joint, thermal stress, failuremode, reliability

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