中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2023, Vol. 23 ›› Issue (3): 030107 . doi: 10.16257/j.cnki.1681-1070.2023.0071

所属专题: 先进三维封装与异质集成

• “先进三维封装与异质集成”专题 • 上一篇    下一篇

基于金刚石的先进热管理技术研究进展*

杜建宇1;唐睿1;张晓宇2;杨宇驰1;张铁宾1;吕佩珏1;郑德印1;杨宇东1;张驰1;姬峰2;余怀强3;张锦文1;王玮1   

  1. 1.北京大学集成电路学院,北京 100091;2.北京遥感设备研究所,北京 100854;3.中国电子科技集团公司第二十六研究所,重庆400060
  • 收稿日期:2023-01-04 出版日期:2023-03-24 发布日期:2023-03-08
  • 作者简介:杜建宇(1998—),男,安徽合肥人,博士研究生,主要研究方向为电子器件的先进热管理技术。

Research Progress ofDiamond-Based Advanced Thermal Management Technology

DU Jianyu1, TANG Rui1, ZHANG Xiaoyu2, YANG Yuchi1, ZHANG Tiebin1, LU Peijue1, ZHENG Deyin1, YANG Yudong1, ZHANG Chi1, JI Feng2, YU Huaiqiang3, ZHANG Jinwen1, WANG Wei1   

  1. 1. Schoolof Integrated Circuits, Peking University, Beijing 100091, China;2. BeijingInstitute of Remote Sensing Equipment, Beijing 100854, China;3.China Electronics Technology Group Corporation No. 26 Research Institute, Chongqing400060, China
  • Received:2023-01-04 Online:2023-03-24 Published:2023-03-08

摘要: 以GaN为代表的新一代半导体材料具有宽禁带、高电子饱和速率、高击穿场强等优异的电学性能,使得射频、电力电子器件有了具备更高功率能力的可能,目前限制器件功率提升的主要瓶颈在于缺少与之匹配的散热手段。具有极高热导率的金刚石已成为提升器件散热能力的重要材料,学术界针对金刚石与功率器件集成的先进热管理技术已经开展了大量有益的研究与探索,但是由于金刚石具有极强的化学惰性和超高的硬度,在实际集成和工艺加工过程中,金刚石?GaN界面容易出现热性能和可靠性问题,甚至会导致器件失效。对金刚石热管理技术的研究进展和存在的问题进行深入分析,并对未来主要工作方向做了展望。

关键词: 热管理, 功率器件, 金刚石, 嵌入式冷却

Abstract: The new generation of semiconductor materials represented by GaN has excellent electrical properties, including large bandgap, high electron saturation rate and high breakdown electric field, have the potential to make the radio and power electronic devices with better power performance. More efficient cooling techniques are needed to ensure the power performance of the devices. The diamond substrate has become the ideal heat spreader because of its highly thermally conduction, and a lot of useful studies and explorations have been carried out in academic circles for the advanced thermal management technology of diamond and power device integration, but due to the strong chemical inertness and ultra-high hardness of diamond, in the actual integration and process processing process, it is easy to cause the diamond-GaN interface thermal performance and reliability problems, which can even lead to device failure. The research progress and problems ofdiamond-based thermal management technology are analyzed deeply, and an outlook on future work is provided.

Key words: thermal management, power device, diamond, embedded cooling

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