关键词: CMOS图像传感器, 低噪声, 相关多采样, 模数转换器

Abstract: As a typical solid-state imaging sensor, CMOS image sensors (CIS) employ a standard CMOS process to integrate pixels and signal processing circuits into a single chip. However, unavoidable noise in the design process of CIS could introduce random variations to images, which have an adverse effect on the image quality and signal-to-noise ratio, particularly in low-light conditions. It is therefore necessary to take measures to minimize the effects of noise as much as possible in order to improve the imaging quality of CIS. This study reviews the architecture and typical noise model of CIS, analyzes in detail the latest progress and comparison of various noise suppression methods and various indexes from both pixel units and readout circuits, and discusses and looks forward to the possible development direction of designing low-noise CIS.

Key words: CMOS image sensor, low noise, correlated multiple sampling, analog-to-digital converter