关键词: 微控制器板卡, 失效分析, ESD/EOS防护, 生产良率

Abstract: To address the high failure rate of a microcontroller unit board during mass production, a systematic failure analysis and engineering remediation study was conducted. Through electrical characteristic testing, post-de-packaging microscopic inspection, and production environment monitoring, the root causes were identified as production line grounding hazards, non-standardized operations, and inadequate hardware circuit protection. Comprehensive corrective actions were implemented, including grounding system upgrades, standardized operating procedures, and enhanced circuit protection. After batch validation of 2 500 units, all passed testing with the failure rate reduced to zero. Results demonstrate that integrated improvements in electrical safety, standardized operational management, and refined hardware circuit design effectively eliminate electrostatic discharge (ESD) and electrical overstress (EOS) risks, significantly boosting production yield. This approach holds substantial engineering reference value for reducing failure rates in electronic manufacturing processes.

Key words: microcontroller unit board, failure analysis, ESD/EOS protection, production yield