中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2020, Vol. 20 ›› Issue (10): 100204 . doi: 10.16257/j.cnki.1681-1070.2020.1009

• 封装、组装与测试 • 上一篇    下一篇

基于ATE的数控电位计非线性误差测试优化

季伟伟;张凯虹;何 立   

  1. 中科芯集成电路有限公司,江苏 无锡 214072
  • 收稿日期:2020-04-24 发布日期:2020-06-02
  • 作者简介:季伟伟(1990—),男,江苏盐城人,硕士研究生,主要从事集成电路测试工作。

Test Optimizationof Nonlinear Error of Digitally Controlled Potentiometer Based on ATE

JI Weiwei, ZHANG Kaihong, HE Li   

  1. China Key System & IntegratedCircuit Co., Ltd., Wuxi 214072, China
  • Received:2020-04-24 Published:2020-06-02

摘要: 非线性误差是反映数控电位计精度的一项重要指标,针对ATE测试系统数字通道与模拟通道存在阻容负载及通道间耦合电容,影响数控电位计非线性误差精度测量的问题,通过在数控电位计滑动端与测试机模拟通道之间加入高输入阻抗电压跟随器,保证输出测试值不变的情况下使滑动端与后级负载形成开路,从而消除测试机负载对非线性误差的影响,实现数控电位计非线性误差的高精度测试。

关键词: 数控电位计, 非线性误差, ATE

Abstract: The non-linear error is an important index to reflect the accuracy of the digitally controlled potentiometer. For resistance and capacitance load exists between digital channel and analog channel in ATE test system, which can affect the measurement of nonlinear error accuracy of the digitally controlled potentiometer. This paper adds the high input impedance voltage follower between the sliding end of potentiometer and the analog channel of ATE. It can keep the output constant and keep open between the sliding end and the load, which can eliminate the influence of the load of ATE on the non-linear error, and realize the high accuracy test of the non-linear error of the digitally controlled potentiometer.

Key words: digitally controlled potentiometers;nonlinear error, ATE

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