中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装

• 封装、组装与测试 •    下一篇

临时键合工艺中晶圆翘曲研究

李硕,柳博,叶振文,方上声,陈伟,黄明起   

  1. 深圳市化讯半导体材料有限公司,广东  深圳  518103
  • 收稿日期:2024-10-24 修回日期:2025-03-18 出版日期:2025-04-25 发布日期:2025-04-25
  • 通讯作者: 柳博
  • 基金资助:
    深圳市创新创业计划科技重大专项项目(重202325N241)

Wafer Warpage Studies in Temporary Bonding Processes

LI Shuo, LIU Bo, YE Zhenwen, Fang Shangsheng, CHEN Wei, HUANG Mingqi   

  1. Shenzhen Samcien Semiconductor Materials Co., Ltd., Shenzhen 518103, China
  • Received:2024-10-24 Revised:2025-03-18 Online:2025-04-25 Published:2025-04-25

摘要: 在先进封装领域,包括晶圆减薄、圆片级封装、三维封装、晶圆背面加工以及多芯片封装体的晶圆重构等关键工艺中,临时键合技术发挥着至关重要的作用。针对该技术在异质热压键合引发的翘曲进行了深入分析,并提出了解决方案,包括衬底和临时键合胶的优选、旋涂工艺的优化以及键合参数的调整,以满足先进封装对低翘曲临时键合工艺的需求。

关键词: 先进封装, 临时键合, 翘曲, 衬底选择, 工艺解决方案

Abstract: In the field of advanced packaging, including key processes such as wafer thinning, wafer-level packaging, three-dimensional packaging, backside wafer processing, and wafer reconfiguration in multi-chip package bodies, temporary bonding technology plays a crucial role. This study conducts an in-depth analysis of the warpage caused by this technology in different packaging processes, dielectric types, and wafer sizes, and proposes solutions, including the optimization of substrates and temporary bonding adhesives, optimization of spin coating processes, and adjustment of bonding parameters, to meet the demand for low-warpage temporary bonding processes in advanced packaging.

Key words: advanced packaging, temporary bonding, warpage, substrate selection, process solutions