中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2025, Vol. 25 ›› Issue (6): 060303 . doi: 10.16257/j.cnki.1681-1070.2025.0059

• 电路与系统 • 上一篇    下一篇

面向CMOS图像传感器的噪声抑制研究进展*

陈建涛1,郭劼2,钟啸宇1,顾晓峰1,虞致国1   

  1. 1. 江南大学集成电路学院,江苏 无锡? 214401;2. 中电海康无锡科技有限公司,江苏 无锡 ?214028
  • 收稿日期:2024-10-28 出版日期:2025-06-27 发布日期:2025-01-20
  • 作者简介:陈建涛(2000—),男,江西抚州人,硕士研究生,主要研究方向为模拟集成电路设计;

Research Progress on Noise Suppression for CMOS Image Sensors

CHEN Jiantao1, GUO Jie2, ZHONG Xiaoyu1, GU Xiaofeng1, YU Zhiguo1   

  1. 1.?? School of Integrated Circuits,Jiangnan University, Wuxi 214401, China; 2. Cethik Wuxi Technology Co., Ltd., Wuxi 214028, China
  • Received:2024-10-28 Online:2025-06-27 Published:2025-01-20

摘要: 作为一种典型的固体成像传感器,CMOS图像传感器(CIS)利用标准的CMOS工艺将像素、信号处理电路集成到一块芯片上。在CIS的设计过程中,噪声的存在会给图像引入随机变化,给图像质量和信噪比带来不利影响,尤其是在低光照条件下,这种影响更加明显。为了提高CIS的成像质量,必须采取措施以最大限度地减小噪声的影响。回顾了CIS的架构和典型的噪声模型,从像素单元和读出电路2方面详细分析了各种噪声抑制方法的最新进展和各项指标对比,并讨论和展望了低噪声CIS可能的发展方向。

关键词: CMOS图像传感器, 低噪声, 相关多采样, 模数转换器

Abstract: As a typical solid-state imaging sensor, CMOS image sensor (CIS) employs a standard CMOS process to integrate pixels and signal processing circuits into a single chip. Noise in the design process of CIS introduces random variations to the image, bringing about adverse effects on the image quality and signal-to-noise ratio, particularly under low-light conditions. It is necessary to take measures to minimize the effects of noise as much as possible in order to improve the imaging quality of CIS. The architecture and typical noise models of CIS are reviewed, the latest progress of various noise suppression methods and comparison of various indexes from both pixel units and readout circuits are analyzed in detail, and the possible development direction of low-noise CIS is discussed and outlooked.

Key words: CMOS image sensor, low noise, correlated multiple sampling, analog-to-digital converter

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