电子与封装
• 封装、组装与测试 • 下一篇
朱洪，李星毅，易忠，宋建磊
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ZHU Hong, LI Xingyi, YI Zhong, SONG Jianlei
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摘要： FPGA具有可编程性、高可靠性、方便使用等特点，被广泛应用于航空航天、通信电子等行业，因而对FPGA的测试具有重要意义。本文以XC7K系列FPGA为研究对象，基于ATE设备，阐述了FPGA的测试方法。文章首先介绍了XC7K系列FPGA的资源和相关测试，然后探讨了FPGA测试的全流程和测试原理、方法，最后对FPGA进行了测试验证。实验结果表明，本文的FPGA测试开发流程能快速有效开发XC7K系列FPGA测试程序，测试流程可供相关从业人员参考。
关键词: FPGA, ATE, 测试原理, 测试技术
Abstract: FPGAs are widely used in industries such as aerospace and communication electronics due to their programmability, high reliability, and user-friendliness, thus making FPGA testing highly significant. This paper focuses on the XC7K series FPGAs and elucidates the testing methodology based on Automated Test Equipment. It begins by introducing the resources and related testing of the XC7K series FPGAs, then discusses the complete FPGA testing flow, test principles, and methods, and finally presents test verification. Experimental results demonstrate that the FPGA test development process proposed in this paper enables rapid and effective development of test programs for the XC7K series FPGAs. The testing process can serve as a valuable reference for relevant practitioners.
Key words: FPGA, ATE, test principle, test technology
朱洪, 李星毅, 易忠, 宋建磊. 基于ATE的XC7K系列FPGA测试技术研究[J]. 电子与封装, doi: 10.16257/j.cnki.1681-1070.2026.0059.
ZHU Hong, LI Xingyi, YI Zhong, SONG Jianlei. Research on Test Technology of XC7K Series FPGA Based on ATE[J]. Electronics & Packaging, doi: 10.16257/j.cnki.1681-1070.2026.0059.
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链接本文: https://ep.org.cn/CN/10.16257/j.cnki.1681-1070.2026.0059
