关键词: ATE, SRAM, 测试, 功能, 交流参数

Abstract: With the rapid development of integrated circuit technology,the application of SRAM is becoming more and more extensive.Testing technology of integrated circuit has been paid more and more attention.The paper briefly introduces the important components of SRAM,and puts forward the way of testing SRAM by ATE.SRAM testing includes functional testing,DC parameter testing,AC parameter testing.Functional testing and AC parametertesting are essentialformemory.Forexample,functionalcode testing of IS61LV51216-10TLI is edited by UltraEdit software.Functional code is read and written in the different memory units of the device to check its function.The key technology and precations of function and AC parameterstestingofSRAMare mainlystated.

Key words: ATE, SRAM, testing, function, Acparameter