中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装

• 封装、组装与测试 •    下一篇

面向超低弧的引线键合工艺研究

戚再玉,王继忠,施福勇,王贵   

  1. 无锡中微高科电子有限公司,江苏 无锡  214035
  • 收稿日期:2024-12-15 修回日期:2025-03-24 出版日期:2025-09-15 发布日期:2025-09-15
  • 通讯作者: 戚再玉

Research on Bonding Process for Ultra-low Loop

QI Zaiyu, WANG Jizhong, SHI Fuyong, WANG Gui   

  1. Wuxi Zhongwei High-Tech Electronics Co., Ltd,. Wuxi 214035, China
  • Received:2024-12-15 Revised:2025-03-24 Online:2025-09-15 Published:2025-09-15

摘要: 叠层封装技术是一种广泛应用的三维封装技术,该技术能够满足电子产品高性能、轻重量、低功耗、小尺寸等需求。由于该技术的特殊构造,传统的引线键合技术形成的100~200 μm线弧高度已难以满足要求。超低线弧技术主要是降低键合线弧的高度,将线弧高度降低到50 μm甚至更低,从而提高封装的密度,满足薄型化的发展需求。在线弧高度在50 μm或更低的应用场景下,这类技术的应用对于提升电子器件的性能、密度至关重要。通过优化线弧参数和验证测试,在保证超低线弧的机械性能的情况下,提高键合质量和线弧的稳定性,并对验证过程中出现的困难点进行分析和改善,最终实现了超低弧封装的工艺研究。

关键词: 键合, 超低弧, 叠层

Abstract: Laminated packaging technology is a widely used 3D packaging technology, which can meet the requirements of high performance, light weight, low power consumption and small size of electronic products. Due to the special structure of this technology, the arc height of 100~200μm formed by traditional wire bonding technology is difficult to meet the requirements. Ultra-low line arc technology is mainly to reduce the height of the bonded line arc, reduce the line arc height to 50μm or even lower, so as to improve the density of the package, to meet the development needs of thin. In the application scenario of the in-line arc height of 50μm or less, the application of such technology is very important to improve the performance and density of electronic devices. By optimizing the arc parameters and verification test, the bonding quality and stability of the ultra-low arc are improved while ensuring the mechanical properties of the ultra-low arc, and the difficulties in the verification process are analyzed and improved, and the process research of ultra-low arc packaging is finally realized.

Key words: Lamination, Bonding, Ultra-low arc